报告题目:压电力和磁力显微镜的高级应用及原理

报 告 人:陈伟刚（Bruker Nano Surface）

报告时间:2014年5月5日（星期一）,10:00

地     点: 威廉希尔六层学术报告厅（长安校区致知楼3623-3624）

报告人简介:

Chen Weigang has a position of application engineer in Bruker Nano Surface in Shanghai, China. He specializes in Atomic Force Microscopy (AFM) and its application in various research fields, especially PFM, CAFM and other advanced AFM modes in oxide thin films. He obtained his bachelor’s degree in Materials Chemistry in Nanjing University (NJU) and pursues PhD study in Nanyang Technological University (NTU), Singapore.